Bitte melden Sie sich an um selbst Rezensionen oder Kommentare zu erstellen.
Zitieren Sie diese Publikation
Mehr Zitationsstile
- bitte auswählen -
%0 Conference Paper
%1 conf/irps/PandePKKR19
%A Pande, Nakul
%A Park, Gyusung
%A Kim, Chris H.
%A Krishnan, Srikanth
%A Reddy, Vijay
%B IRPS
%D 2019
%I IEEE
%K dblp
%P 1-6
%T Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.
%U http://dblp.uni-trier.de/db/conf/irps/irps2019.html#PandePKKR19
%@ 978-1-5386-9504-3
@inproceedings{conf/irps/PandePKKR19,
added-at = {2019-05-31T00:00:00.000+0200},
author = {Pande, Nakul and Park, Gyusung and Kim, Chris H. and Krishnan, Srikanth and Reddy, Vijay},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/271304b22691ced7298b412061d9e9189/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2019},
ee = {https://doi.org/10.1109/IRPS.2019.8720564},
interhash = {1cbf745fbe0f981e88f19b71e7516429},
intrahash = {71304b22691ced7298b412061d9e9189},
isbn = {978-1-5386-9504-3},
keywords = {dblp},
pages = {1-6},
publisher = {IEEE},
timestamp = {2019-09-27T13:33:20.000+0200},
title = {Investigating the Aging Dynamics of Diode-Connected MOS Devices Using an Array-Based Characterization Vehicle in a 65nm Process.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2019.html#PandePKKR19},
year = 2019
}
