%0 Journal Article %1 journals/mr/AlvaradoBKF10 %A Alvarado, Joaquín %A Boufouss, El Hafed %A Kilchytska, Valeria %A Flandre, Denis %D 2010 %J Microelectronics Reliability %K dblp %N 9-11 %P 1852-1856 %T Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#AlvaradoBKF10 %V 50

@article{journals/mr/AlvaradoBKF10, added-at = {2018-11-30T00:00:00.000+0100}, author = {Alvarado, Joaquín and Boufouss, El Hafed and Kilchytska, Valeria and Flandre, Denis}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27733b0936fd82a621711a5edc7559316/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.07.040}, interhash = {0a6b72693128afa6f10b7305fef12ad3}, intrahash = {7733b0936fd82a621711a5edc7559316}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1852-1856}, timestamp = {2019-09-27T10:58:27.000+0200}, title = {Compact model for single event transients and total dose effects at high temperatures for partially depleted SOI MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#AlvaradoBKF10}, volume = 50, year = 2010 }