%0 Journal Article %1 journals/mr/PalczynskaGMHM16 %A Palczynska, Alicja %A Gromala, Przemyslaw Jakub %A Mayer, Dirk %A Han, Bongtae %A Melz, Tobias %D 2016 %J Microelectronics Reliability %K dblp %P 58-62 %T In-situ investigation of EMC relaxation behavior using piezoresistive stress sensor. %U http://dblp.uni-trier.de/db/journals/mr/mr62.html#PalczynskaGMHM16 %V 62

@article{journals/mr/PalczynskaGMHM16, added-at = {2018-11-30T00:00:00.000+0100}, author = {Palczynska, Alicja and Gromala, Przemyslaw Jakub and Mayer, Dirk and Han, Bongtae and Melz, Tobias}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2eeb5e571c59ce5ed1bf462c4df02f7bd/dblp}, ee = {https://doi.org/10.1016/j.microrel.2016.03.013}, interhash = {08ab000d373717d7f2d75d8d1a7d9857}, intrahash = {eeb5e571c59ce5ed1bf462c4df02f7bd}, journal = {Microelectronics Reliability}, keywords = {dblp}, pages = {58-62}, timestamp = {2019-09-27T10:58:08.000+0200}, title = {In-situ investigation of EMC relaxation behavior using piezoresistive stress sensor.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr62.html#PalczynskaGMHM16}, volume = 62, year = 2016 }