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A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
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T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
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T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)