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8Planning of reliability life tests within the accuracy, time and cost triangle
M. Dazer, M. Stohrer, S. Kemmler, and B. Bertsche. 2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR), page 1-9. IEEE, (September 2016)259 (peer-review).
4 years ago by @ima-publ
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B_Bertsche
M_Dazer
M_Stohrer
S_Kemmler
Zuverlässigkeitstechnik
from:martindazer
from:samuelschwamm
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B_BertscheM_DazerM_StohrerS_KemmlerZuverlässigkeitstechnikfrom:martindazerfrom:samuelschwammfrom:thomasherzigmyownpeer-review
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