E. Wagemann, T. Haist, and H. Tiziani. Optics communications, (1998)6 cites: https://scholar.google.com/scholar?cites=18152547233854539301&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and K. Korner. Proceedings of International Conference On Laser …, (2003)9 cites: https://scholar.google.com/scholar?cites=1836599854242513742&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, E. Wagemann, and .... Laser Metrology and …, (1999)9 cites: https://scholar.google.com/scholar?cites=3277523645490623696&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2008)10 cites: https://scholar.google.com/scholar?cites=17386422767713101032&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, M. Warber, C. Rembe, T. Haist, and W. Osten. Fringe 2009, (2009)8 cites: https://scholar.google.com/scholar?cites=14883763856837803297&as_sdt=2005&sciodt=0,5&hl=en.
L. Seifert, T. Ruppel, T. Haist, and .... Interferometry XIII …, (2006)2 cites: https://scholar.google.com/scholar?cites=7147880278335580806&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Comput. Sci. Eng., (2006)3 cites: https://scholar.google.com/scholar?cites=14566195398217273875&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1999)6 cites: https://scholar.google.com/scholar?cites=7686503495750243020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, T. Haist, M. Warber, and S. Osten. Proceedings of SPIE, (2007)3 cites: https://scholar.google.com/scholar?cites=17443734874373782994&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI Berichte, (1981)3 cites: https://scholar.google.com/scholar?cites=6001163947811595426&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optical Inspection and …, (1997)3 cites: https://scholar.google.com/scholar?cites=4086429519103832408&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, T. Haist, and .... … Measurement Systems for …, (2007)3 cites: https://scholar.google.com/scholar?cites=13122883090839124938&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, W. Osten, M. Reicherter, and .... Optical Information …, (2003)3 cites: https://scholar.google.com/scholar?cites=13914692911788684678&as_sdt=2005&sciodt=0,5&hl=en.
D. Fleischle, W. Lyda, T. Haist, and W. Osten. DGaO Proceedings, (2009)4 cites: https://scholar.google.com/scholar?cites=16419362578584721445&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. International Workshop on Optical Supercomputing, (2009)5 cites: https://scholar.google.com/scholar?cites=15570446517660484183&as_sdt=2005&sciodt=0,5&hl=en.
C. Rembe, and T. Haist. US Patent 8,115,933, (2012)5 cites: https://scholar.google.com/scholar?cites=13085958234674355483&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... Proc. SPIE, (2012)3 cites: https://scholar.google.com/scholar?cites=3562043095514685385&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Optical Micro-and Nanometrology …, (2012)5 cites: https://scholar.google.com/scholar?cites=8284401030473063862&as_sdt=2005&sciodt=0,5&hl=en.
M. Warber, T. Haist, M. Hasler, and W. Osten. Optical Engineering, (2012)5 cites: https://scholar.google.com/scholar?cites=11260130449230490731&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, M. Winter, and .... AIP Conference …, (2012)5 cites: https://scholar.google.com/scholar?cites=2722836634404284020&as_sdt=2005&sciodt=0,5&hl=en.
F. Schaal, T. Haist, A. Peter, A. Beeck, and .... Proc. SPIE, (2014)4 cites: https://scholar.google.com/scholar?cites=15964016983552008003&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. Journal of Micro/Nanolithography, MEMS …, (2015)7 cites: https://scholar.google.com/scholar?cites=16007974591760507561&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, J. Stahl, T. Haist, and W. Osten. Optical Engineering, (2015)4 cites: https://scholar.google.com/scholar?cites=2954937903817151273&as_sdt=2005&sciodt=0,5&hl=en.
W. Osten, T. Haist, and E. Manske. Ultra-High-Definition Imaging …, (2018)4 cites: https://scholar.google.com/scholar?cites=15533727869778562690&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, and .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and .... Forum Bildverarbeitung …, (2016)2 cites: https://scholar.google.com/scholar?cites=8919893009457312879&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt. Optics and Photonics for Advanced Dimensional Metrology II, 12137, page 1213702. International Society for Optics and Photonics, SPIE, (2022)
S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt. Optical Sensing and Detection VII, 12139, page 121390I. International Society for Optics and Photonics, SPIE, (2022)