S. Dong, T. Haist, T. Dietrich, and W. Osten. Unconventional Imaging and Wavefront Sensing 2014, 9227, page 922702. International Society for Optics and Photonics, SPIE, (2014)
H. Yang, T. Haist, M. Gronle, and W. Osten. Optical Measurement Systems for Industrial Inspection IX, 9525, page 952522. International Society for Optics and Photonics, SPIE, (2015)
H. Yang, T. Haist, M. Gronle, and W. Osten. Automated Visual Inspection and Machine Vision II, 10334, page 1033405. International Society for Optics and Photonics, SPIE, (2017)
T. Haist, A. Steinitz, and F. Guerra. Optics and Photonics for Advanced Dimensional Metrology, 11352, page 1135204. International Society for Optics and Photonics, SPIE, (2020)
R. Hahn, J. Görres, T. Haist, W. Osten, and S. Reichelt. Optical Sensing and Detection VII, 12139, page 121390I. International Society for Optics and Photonics, SPIE, (2022)
S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
S. Hartlieb, M. Boguslawski, T. Haist, and S. Reichelt. Optics and Photonics for Advanced Dimensional Metrology II, 12137, page 1213702. International Society for Optics and Photonics, SPIE, (2022)
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, and .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and .... Forum Bildverarbeitung …, (2016)2 cites: https://scholar.google.com/scholar?cites=8919893009457312879&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
L. Seifert, T. Ruppel, T. Haist, and .... Interferometry XIII …, (2006)2 cites: https://scholar.google.com/scholar?cites=7147880278335580806&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Reicherter, M. Wu, and L. Seifert. Comput. Sci. Eng., (2006)3 cites: https://scholar.google.com/scholar?cites=14566195398217273875&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optics communications, (1999)6 cites: https://scholar.google.com/scholar?cites=7686503495750243020&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Schönleber, and H. Tiziani. Applied optics, (1998)3 cites: https://scholar.google.com/scholar?cites=13523355979693248351&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, T. Haist, M. Warber, and S. Osten. Proceedings of SPIE, (2007)3 cites: https://scholar.google.com/scholar?cites=17443734874373782994&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI Berichte, (1981)3 cites: https://scholar.google.com/scholar?cites=6001163947811595426&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. Optical Inspection and …, (1997)3 cites: https://scholar.google.com/scholar?cites=4086429519103832408&as_sdt=2005&sciodt=0,5&hl=en.