H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)