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Predictive error detection by on-line aging monitoring.

J. Vázquez, V. Champac, A. Ziesemer, R. Reis, J. Semião, I. Teixeira, M. Santos, and J. Teixeira. IOLTS, page 9-14. IEEE Computer Society, (2010)

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Impact of Power Supply Voltage Variations on FPGA-Based Digital Systems Performance.J. Freijedo, L. Costas, J. Semião, J. Rodríguez-Andina, M. Moure, F. Vargas, I. Teixeira, and J. Teixeira. J. Low Power Electronics, 6 (2): 339-349 (2010)Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits.J. Freijedo, J. Semião, J. Rodríguez-Andina, F. Vargas, I. Teixeira, and J. Teixeira. J. Electronic Testing, 28 (4): 421-434 (2012)Improving the Tolerance of Pipeline Based Circuits to Power Supply or Temperature Variations.J. Semião, J. Rodríguez-Andina, F. Vargas, M. Santos, I. Teixeira, and J. Teixeira. DFT, page 303-311. IEEE Computer Society, (2007)Adaptive Error-Prediction Flip-flop for performance failure prediction with aging sensors.C. Martins, J. Semião, J. Vázquez, V. Champac, M. Santos, I. Teixeira, and J. Teixeira. VTS, page 203-208. IEEE Computer Society, (2011)Delay Modeling for Power Noise and Temperature-Aware Design and Test of Digital Systems.J. Freijedo, J. Semião, J. Rodríguez-Andina, F. Vargas, I. Teixeira, and J. Teixeira. J. Low Power Electronics, 4 (3): 385-391 (2008)Fault-tolerance in FPGA focusing power reduction or performance enhancement.C. Leong, J. Semião, M. Santos, I. Teixeira, and J. Teixeira. LATS, page 1-6. IEEE Computer Society, (2015)Embedded tutorial: TRP: integrating embedded test and ATE.Y. Zorian, P. Prinetto, J. Teixeira, I. Teixeira, C. Pereira, O. Dias, J. Semião, P. Muhmenthaler, and W. Radermacher. DATE, page 34-37. IEEE Computer Society, (2001)SRAM Performance Sensor.J. Semião, L. Santos, and M. Santos. DCIS, page 1-6. IEEE, (2021)Time Management for Low-Power Design of Digital Systems.J. Semião, J. Freijedo, J. Rodríguez-Andina, F. Vargas, M. Santos, I. Teixeira, and P. Teixeira. J. Low Power Electronics, 4 (3): 410-419 (2008)Process Variations-Aware Statistical Analysis Framework for Aging Sensors Insertion.J. Vázquez, V. Champac, J. Semião, I. Teixeira, M. Santos, and J. Teixeira. J. Electronic Testing, 29 (3): 289-299 (2013)

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Predictive error detection by on-line aging monitoring.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Predictive error detection by on-line aging monitoring.

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Predictive error detection by on-line aging monitoring.