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When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG., , and . NATW, page 32-39. IEEE, (2014)On Reducing Scan Shift Activity at RTL., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (7): 1110-1120 (2010)A Cost Effective Approach for Online Error Detection Using Invariant Relationships., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 29 (5): 788-801 (2010)On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction., , , , , and . Asian Test Symposium, page 151-. IEEE Computer Society, (2000)Using implications to choose tests through suspect fault identification., , , , , and . ACM Trans. Design Autom. Electr. Syst., 18 (1): 14:1-14:19 (2012)Can Soft Errors be Handled Securely?, and . ISVLSI, page 124-129. IEEE Computer Society, (2018)A case study: Leverage IEEE 1687 based method to automate modeling, verification, and test access for embedded instruments in a server processor., , , , , , and . ITC, page 1-10. IEEE, (2015)Defect-Oriented Testing and Defective-Part-Level Prediction., , , , , , , and . IEEE Design & Test of Computers, 18 (1): 31-41 (2001)An Analysis of Defect Detection for Weighted Random Patterns Generated with Observation/Excitation-Aware Partial Fault Targeting.. VTS, page 205-210. IEEE Computer Society, (2007)Special session 4B: Elevator talks., , , , , , , , and . VTS, page 1. IEEE Computer Society, (2013)