Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

SCADA system design: A proposal for optimizing a production line., , and . CONIELECOMP, page 192-197. IEEE, (2016)Possibilities of defect-size magnification for testing resistive-opens in nanometer technologies., , and . LATW, page 1-6. IEEE, (2014)Voltage Regulation System for UHF RFID Tags., , , , and . SBCCI, page 1-6. IEEE, (2013)TCAD analysis and modeling for NBTI mechanism in FinFET transistors., , , and . IEICE Electronic Express, 15 (14): 20180502 (2018)Screening small-delay defects using inter-path correlation to reduce reliability risk., , and . Microelectronics Reliability, 55 (6): 1005-1011 (2015)Small-delay defects detection under process variation using Inter-Path Correlation., , , and . VTS, page 127-132. IEEE Computer Society, (2012)Voltage Regulation System for UHF RFID Tags., , , , and . SBCCI, page 1-6. IEEE, (2013)Low VDD and body bias conditions for testing bridge defects in the presence of process variations., , , and . Microelectronics Journal, 46 (5): 398-403 (2015)Computing the Detection Probability for Small Delay Defects of Nanometer ICs., and . J. Electronic Testing, 27 (6): 741-752 (2011)Computing the detection of Small Delay Defects caused by resistive opens of nanometer ICs., and . European Test Symposium, page 126-131. IEEE Computer Society, (2010)