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Scalable High Voltage CMOS technology for Smart Power and sensor applications.

M. Schrems, M. Knaipp, H. Enichlmair, V. Vescoli, R. Minixhofer, E. Seebacher, F. Leisenberger, E. Wachmann, G. Schatzberger, and H. Gensinger. Elektrotechnik und Informationstechnik, 125 (4): 109-117 (2008)

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Using CAD Tool for Substrate Parasitic Modeling in Smart Power Technology.H. Zou, Y. Moursy, R. Iskander, A. Steinmair, H. Gensinger, E. Seebacher, J. Chaput, and M. Louërat. IEEE Trans. on Circuits and Systems, 63-I (12): 2323-2333 (2016)Analysis of substrate currents propagation in HVCMOS technology.C. Stefanucci, P. Buccella, E. Seebacher, A. Steinmair, M. Kayal, and J. Sallese. ESSDERC, page 319-322. IEEE, (2016)Scalable High Voltage CMOS technology for Smart Power and sensor applications.M. Schrems, M. Knaipp, H. Enichlmair, V. Vescoli, R. Minixhofer, E. Seebacher, F. Leisenberger, E. Wachmann, G. Schatzberger, and H. Gensinger. Elektrotechnik und Informationstechnik, 125 (4): 109-117 (2008)Towards automatic diagnosis of minority carriers propagation problems in HV/HT automotive smart power ICs.Y. Moursy, H. Zou, R. Iskander, P. Tisserand, D. Ton, G. Pasetti, E. Seebacher, A. Steinmair, T. Gneiting, and H. Alius. DATE, page 265-268. IEEE, (2016)An analytical approach for physical modeling of hot-carrier induced degradation.S. Tyaginov, I. Starkov, H. Enichlmair, C. Jungemann, J. Park, E. Seebacher, R. de Orio, H. Ceric, and T. Grasser. Microelectronics Reliability, 51 (9-11): 1525-1529 (2011)Interface traps density-of-states as a vital component for hot-carrier degradation modeling.S. Tyaginov, I. Starkov, O. Triebl, J. Cervenka, C. Jungemann, S. Carniello, J. Park, H. Enichlmair, M. Karner, C. Kernstock and 4 other author(s). Microelectronics Reliability, 50 (9-11): 1267-1272 (2010)Modeling of dynamic trap density increase for aging simulation of any MOSFET circuits.M. Miura-Mattausch, H. Miyamoto, H. Kikuchihara, D. Navarro, T. Maiti, N. Rohbani, C. Ma, H. Mattausch, A. Schiffmann, A. Steinmair and 1 other author(s). ESSDERC, page 192-195. IEEE, (2017)

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Disambiguation of "Seebacher, Ehrenfried"

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Scalable High Voltage CMOS technology for Smart Power and sensor applications.

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Disambiguation of "Seebacher, Ehrenfried"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Scalable High Voltage CMOS technology for Smart Power and sensor applications.

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Scalable High Voltage CMOS technology for Smart Power and sensor applications.