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Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation.

, , , , , , , , , , , and . ITC, page 1-6. IEEE Computer Society, (2014)

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Soft Error Resiliency Characterization on IBM BlueGene/Q Processor., , , , , , , , , and 2 other author(s). ASP-DAC, page 385-387. IEEE, (2014)POWER7TM local clocking and clocked storage elements., , , , , , , and . ISSCC, page 178-179. IEEE, (2010)Understanding Soft Error Resiliency of Blue Gene/Q Compute Chip through Hardware Proton Irradiation and Software Fault Injection., , , and . SC, page 587-596. IEEE, (2014)Long-term data for BTI degradation in 32nm IBM microprocessor using HKMG technology., , , and . IRPS, page 6. IEEE, (2015)A case study of electromigration reliability: From design point to system operations., , , , and . IRPS, page 2. IEEE, (2015)Soft error resiliency characterization and improvement on IBM BlueGene/Q processor using accelerated proton irradiation., , , , , , , , , and 2 other author(s). ITC, page 1-6. IEEE Computer Society, (2014)Plasma-etching processes for ULSI semiconductor circuits., , , , , , , , , and 5 other author(s). IBM Journal of Research and Development, 43 (1): 39-72 (1999)SOI FinFET soft error upset susceptibility and analysis., , , , , , , , and . IRPS, page 4. IEEE, (2015)