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Testing Delay Faults in Embedded CAMs.

, , , and . Asian Test Symposium, page 378-383. IEEE Computer Society, (2003)

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Testing Delay Faults in Embedded CAMs., , , and . Asian Test Symposium, page 378-383. IEEE Computer Society, (2003)Memory BIST Using ESP., , , , and . VTS, page 243-248. IEEE Computer Society, (2004)Chasing subtle embedded RAM defects for nanometer technologies., , , and . ITC, page 9. IEEE Computer Society, (2005)BIST for Deep Submicron ASIC Memories with High Performance Application., , , , , and . ITC, page 386-392. IEEE Computer Society, (2003)At-Speed Built-in Self-Repair Analyzer for Embedded Word-Oriented Memories., , , , and . VLSI Design, page 895-900. IEEE Computer Society, (2004)