Author of the publication

Simulation and modelling of long term reliability of digital circuits implemented in FPGA.

, , , and . Microelectronics Reliability, (2018)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

A unified multiple stress reliability model for microelectronic devices - Application to 1.55 μm DFB laser diode module for space validation., , , and . Microelectronics Reliability, 55 (9-10): 1729-1735 (2015)GaAs P-HEMT MMIC processes behavior under multiple heavy ion radiation stress conditions combined with DC and RF biasing., , , , , , , , and . Microelectronics Reliability, 53 (9-11): 1466-1470 (2013)The multics virtual memory., , and . SOSP, page 30-42. ACM, (1969)Simulation and modelling of long term reliability of digital circuits implemented in FPGA., , , and . Microelectronics Reliability, (2018)Ordinary Differential Equations.. Concise Encyclopedia of Modelling & Simulation, volume 5 of Advances in systems control and information engineering, Pergamon Press / Elsevier, (1992)The Multics Virtual Memory: Concepts and Design., , and . Commun. ACM, 15 (5): 308-318 (1972)Probabilistic design for reliability in electronics and photonics: Role, significance, attributes, challenges., , , and . IRPS, page 5. IEEE, (2015)A methodologic project to characterize and model COTS component reliability., , , , , and . Microelectronics Reliability, 55 (9-10): 2097-2102 (2015)