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One-Shot Non-Intrusive Calibration Against Process Variations for Analog/RF Circuits.

, , and . IEEE Trans. on Circuits and Systems, 63-I (11): 2022-2035 (2016)

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Internal model control for a self-tuning Delay-Locked Loop in UWB communication systems., , and . IOLTS, page 121-126. IEEE Computer Society, (2011)Ordering of analog specification tests based on parametric defect level estimation., , and . VTS, page 301-306. IEEE Computer Society, (2010)Parameter identification of RF transceiver blocks using regressive models., , and . PDeS, page 67-72. International Federation of Automatic Control, (2009)High-level modeling of power consumption in active linear analog circuits., and . ACM Great Lakes Symposium on VLSI, page 87-90. ACM, (2012)Estimation of Test Metrics for the Optimisation of Analogue Circuit Testing., , , and . J. Electronic Testing, 23 (6): 471-484 (2007)SystemC AMS behavioral modeling of a CMOS video sensor., , and . VLSI-SoC, page 380-385. IEEE, (2011)System-level modeling of electromechanical devices with energy consumption., and . SysCon, page 756-761. IEEE, (2013)Video decoder monitoring using non-linear regression., , and . IOLTS, page 175-178. IEEE, (2013)High-Level Synthesis Methodology for On-Line Testability Optimization., and . IOLTW, page 201-206. IEEE Computer Society, (2000)One-Shot Calibration of RF Circuits Based on Non-Intrusive Sensors., , and . DAC, page 10:1-10:2. ACM, (2014)