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Disambiguation of "Chang, Ik Joon"

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Fast and accurate estimation of nano-scaled SRAM read failure probability using critical point sampling.

, , , , and . CICC, page 439-442. IEEE, (2005)

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Yuki Ikeda University of Stuttgart

Ph. D. Yuji Ikeda University of Stuttgart

 

Other publications of authors with the same name

A 2-Kb One-Time Programmable Memory for UHF Passive RFID Tag IC in a Standard 0.18 µm CMOS Process., , and . IEEE Trans. on Circuits and Systems, 60-I (7): 1810-1822 (2013)Bit-error rate improvement of TLC NAND Flash using state re-ordering., and . IEICE Electronic Express, 9 (23): 1775-1779 (2012)0.2 V 8T SRAM With PVT-Aware Bitline Sensing and Column-Based Data Randomization., , , , , and . J. Solid-State Circuits, 51 (6): 1487-1498 (2016)Robust Level Converter for Sub-Threshold/Super-Threshold Operation: 100 mV to 2.5 V., , , and . IEEE Trans. VLSI Syst., 19 (8): 1429-1437 (2011)A 32 kb 10T Sub-Threshold SRAM Array With Bit-Interleaving and Differential Read Scheme in 90 nm CMOS., , , and . J. Solid-State Circuits, 44 (2): 650-658 (2009)A Radiation Hardened SRAM with Self-refresh and Compact Error Correction., , , , , and . ISOCC, page 235-236. IEEE, (2018)A 28mn FD-SOI 4KB Radiation-hardened 12T SRAM Macro with 0.6 ~ 1V Wide Dynamic Voltage Scaling for Space Applications., , , , and . A-SSCC, page 133-134. IEEE, (2018)A voltage-scalable & process variation resilient hybrid SRAM architecture for MPEG-4 video processors., , and . DAC, page 670-675. ACM, (2009)OBET: On-the-Fly Byte-Level Error Tracking for Correcting and Detecting Faults in Unreliable DRAM Systems., , , and . Sensors, 21 (24): 8271 (2021)Low-complexity decision directed method for carrier frequency offset estimation of IEEE 802.11ad., , , and . ISCAS, page 2163-2166. IEEE, (2013)