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Disambiguation of "Madge, Robert"

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Making Manufacturing Work For You.

, , , , , , , and . DAC, page 107-108. IEEE, (2007)

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Robert Walter University of Stuttgart

Front Cover: The Best of Both Worlds: Combining the Power of MICs and WCAs To Generate Stable and Crystalline CrI-Tetracarbonyl Complexes with π-Accepting Ligands (Chem. Eur. J. 50/2023), , , , , and . Chemistry - A European Journal, 29 (50): e202302316 (2023)

Dr. Robert Löw University of Stuttgart

Replication Data for: Highly efficient real-time spatially resolved sensing of ultraviolet light, , , , , , , and . Dataset, (2025)Related to: Yannick Schellander, Fabian Munkes, Alexander Trachtmann, Patrick Schalberger, Robert Löw, Harald Kübler, Tilman Pfau, Norbert Fruehauf, "Highly efficient real-time spatially resolved sensing of ultraviolet light," Proc. SPIE 13109, Metamaterials, Metadevices, and Metasystems 2024, 1310906 (2024). doi: 10.1117/12.3028038.
Replication Data for: Highly efficient real-time spatially resolved sensing of ultraviolet light, , , , , , , and . Dataset, (2025)Related to: Yannick Schellander, Fabian Munkes, Alexander Trachtmann, Patrick Schalberger, Robert Löw, Harald Kübler, Tilman Pfau, Norbert Fruehauf, "Highly efficient real-time spatially resolved sensing of ultraviolet light," Proc. SPIE 13109, Metamaterials, Metadevices, and Metasystems 2024, 1310906 (2024). doi: 10.1117/12.3028038.Replication Data for: Ultraviolet Photodetectors and their Readout Realization for Future Active-Matrix Sensing, , , , , , , and . Dataset, (2025)Related to: Y. Schellander, M. Schamber, F. Munkes, R. Loew, P. Schalberger, H. Kübler, T. Pfau, and N. Fruehauf, “Ultraviolet photodetectors and their readout realization for future active-matrix sensing”, Proceedings of the International Display Workshops,30 (2023), 151-154. doi: 10.36463/idw.2023.0151.

Robert Warnecke University of Stuttgart

Robert Meissner

Robert Wipperfürth University of Stuttgart

 

Other publications of authors with the same name

Detection of Temperature Sensitive Defects Using ZTC., , , and . VTS, page 185-192. IEEE Computer Society, (2004)Neighborhood Selection for IDDQ Outlier Screening at Wafer Sort., , , and . IEEE Design & Test of Computers, 19 (5): 74-81 (2002)Screening MinVDD Outliers Using Feed-Forward Voltage Testing., , , , , , , and . ITC, page 673-682. IEEE Computer Society, (2002)Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs., , , and . VTS, page 39-46. IEEE Computer Society, (2003)Statistical Post-Processing at Wafersort - An Alternative to Burn-in and a Manufacturable Solution to Test Limit Setting for Sub-micron Technologies., , , and . VTS, page 69-74. IEEE Computer Society, (2002)ATE Value Add through Open Data Collection.. ITC, page 1430. IEEE Computer Society, (2004)Impact of Multiple-Detect Test Patterns on Product Quality., , , , , , , and . ITC, page 1031-1040. IEEE Computer Society, (2003)Neighbor Selection for Variance Reduction in IDDQ and Other Parametric Data., , , and . ITC, page 1240. (2002)Making Manufacturing Work For You., , , , , , , and . DAC, page 107-108. IEEE, (2007)Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model., , , , , , , and . ITC, page 1285-1294. IEEE Computer Society, (2004)