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On Computing Signal Probability and Detection Probability of Stuck-at Faults., and . IEEE Trans. Computers, 39 (11): 1369-1377 (1990)An Industrial Case Study of Sticky Path-Delay Faults., , , and . VTS, page 395-402. IEEE Computer Society, (2008)Special session 11C: Hot topic design consideration and silicon evaluation of on-chip monitors.. VTS, page 350. IEEE Computer Society, (2010)A Process Monitor Based Speed Binning and Die Matching Algorithm.. Asian Test Symposium, page 311-316. IEEE Computer Society, (2011)Silicon Evaluation of Cell-Aware ATPG Tests and Small Delay Tests., , , , and . ATS, page 101-106. IEEE Computer Society, (2014)Computing stress tests for interconnect defects., and . Asian Test Symposium, page 143-148. IEEE Computer Society, (1997)An Evolutionary Functional Link Neural Fuzzy Model for Financial Time Series Forecasting., , , and . IJAEC, 2 (3): 39-58 (2011)Ensuring Power-Safe Application of Test Patterns Using an Effective Gating Approach Considering Current Limits., , and . J. Low Power Electronics, 8 (2): 235-247 (2012)Algorithm to extract two-node bridges., and . IEEE Trans. VLSI Syst., 11 (4): 741-744 (2003)Detectability of internal bridging faults in scan chains., , , , and . ASP-DAC, page 678-683. IEEE, (2009)