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Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.

B. Jayaraman, S. Gupta, Y. Zhang, P. Goyal, H. Ho, R. Krishnan, S. Fang, S. Lee, D. Daley, K. McStay, B. Wunder, J. Barth, S. Deshpande, P. Parries, R. Malik, P. Agnello, S. Stiffler, and S. Iyer. ICICDT, page 1-4. IEEE, (2012)

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A Robust Thinning Algorithm for Straightening of Curved Text Line.B. Singh, S. Goswami, P. Goyal, and A. Mittal. SocProS (2), volume 131 of Advances in Intelligent and Soft Computing, page 903-910. Springer, (2011)Electro-photographic-model-based halftoning.P. Goyal, M. Gupta, D. Shaked, C. Staelin, M. Fischer, O. Shacham, R. Jodra, and J. Allebach. Color Imaging: Displaying, Processing, Hardcopy, and Applications, volume 7528 of SPIE Proceedings, page 752810. SPIE, (2010)Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.B. Jayaraman, S. Gupta, Y. Zhang, P. Goyal, H. Ho, R. Krishnan, S. Fang, S. Lee, D. Daley, K. McStay and 8 other author(s). ICICDT, page 1-4. IEEE, (2012)Clustered-Dot Halftoning With Direct Binary Search.P. Goyal, M. Gupta, C. Staelin, M. Fischer, O. Shacham, and J. Allebach. IEEE Trans. Image Processing, 22 (2): 473-487 (2013)Autonomous Aggregate Data Analytics in Untrusted Cloud.G. Mani, D. Ulybyshev, B. Bhargava, J. Kobes, and P. Goyal. AIKE, page 138-141. IEEE Computer Society, (2018)MDCADNet: Multi dilated & context aggregated dense network for non-textual components classification in digital documents.M. Singh, and P. Goyal. Expert Syst. Appl., (2022)Electro-photographic model based stochastic clustered-dot halftoning with direct binary search.P. Goyal, M. Gupta, C. Staelin, M. Fischer, O. Shacham, T. Kashti, and J. Allebach. ICIP, page 1721-1724. IEEE, (2011)Print quality assessment for stochastic clustered-dot halftones using compactness measures.P. Goyal, and J. Allebach. ICIP, page 3792-3796. IEEE, (2016)Using Deep Learning to Classify Burnt Body Parts Images for Better Burns Diagnosis.J. Chauhan, R. Goswami, and P. Goyal. SaMBa@MICCAI, volume 11379 of Lecture Notes in Computer Science, page 25-32. Springer, (2018)

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Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.

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Performance analysis and modeling of deep trench decoupling capacitor for 32 nm high-performance SOI processors and beyond.