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Disambiguation of "Aikyo, Takashi"

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A Capture-Safe Test Generation Scheme for At-Speed Scan Testing.

, , , , , , , , , , and . European Test Symposium, page 55-60. IEEE Computer Society, (2008)

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Other publications of authors with the same name

Test Data Compression for Scan-Based BIST Aiming at 100x Compression Rate., , , , , , , and . IEICE Transactions, 91-D (3): 726-735 (2008)ATREX : Design for Testability System for Mega Gate LSIs., , , , , and . Asian Test Symposium, page 126-. IEEE Computer Society, (1997)A Study of Capture-Safe Test Generation Flow for At-Speed Testing., , , , , , , , , and 1 other author(s). IEICE Transactions, 93-A (7): 1309-1318 (2010)Distribution-Controlled X-Identification for Effective Reduction of Launch-Induced IR-Drop in At-Speed Scan Testing., , , , , , , , and . IEICE Transactions, 94-D (6): 1216-1226 (2011)Small Delay Fault Model for Intra-Gate Resistive Open Defects., , , , , , and . VTS, page 27-32. IEEE Computer Society, (2009)Test Challenge for Deep Sub-micron Era - Test & Diagnosis Platform: STARCAD-Clouseau.. DFT, page 227. IEEE Computer Society, (2010)Test Generation and Diagnostic Test Generation for Open Faults with Considering Adjacent Lines., , , , , , and . DFT, page 243-251. IEEE Computer Society, (2007)Issues on SOC testing in DSM area: embedded tutorial.. ASP-DAC, page 515-516. ACM, (2000)A novel post-ATPG IR-drop reduction scheme for at-speed scan testing in broadcast-scan-based test compression environment., , , , , , , and . ICCAD, page 97-104. ACM, (2009)Test Data Compression of 100x for Scan-Based BIST., , , , , , , and . ITC, page 1-10. IEEE Computer Society, (2006)