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Facilitating Reuse in Multi-goal Test-Suite Generation for Software Product Lines.

J. Bürdek, M. Lochau, S. Bauregger, A. Holzer, A. von Rhein, S. Apel, and D. Beyer. FASE, volume 9033 of Lecture Notes in Computer Science, page 84-99. Springer, (2015)

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Malte Gerber University of Stuttgart

Dr. -Ing. Malte von Scheven University of Stuttgart

Malte Brunn

Malte Sönnichsen University of Stuttgart

Malte Woidt University of Stuttgart

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Model-based pairwise testing for feature interaction coverage in software product line engineering.M. Lochau, S. Oster, U. Goltz, and A. Schürr. Software Quality Journal, 20 (3-4): 567-604 (2012)Minimum/maximum delay testing of product lines with unbounded parametric real-time constraints.L. Luthmann, T. Gerecht, A. Stephan, J. Bürdek, and M. Lochau. Journal of Systems and Software, (2019)Improved Conflict Detection for Graph Transformation with Attributes.G. Kulcsár, F. Deckwerth, M. Lochau, G. Varró, and A. Schürr. GaM, volume 181 of EPTCS, page 97-112. (2015)Compositionality, Decompositionality and Refinement in Input/Output Conformance Testing.L. Luthmann, S. Mennicke, and M. Lochau. FACS, volume 10231 of Lecture Notes in Computer Science, page 54-72. (2016)Mathematical Programming for Anomaly Analysis of Clafer Models.M. Weckesser, M. Lochau, M. Ries, and A. Schürr. MoDELS, page 34-44. ACM, (2018)CardyGAn: Tool Support for Cardinality-based Feature Models.T. Schnabel, M. Weckesser, R. Kluge, M. Lochau, and A. Schürr. VaMoS, page 33-40. ACM, (2016)Dynamic configuration management of cloud-based applications.J. Schroeter, P. Mucha, M. Muth, K. Jugel, and M. Lochau. SPLC (2), page 171-178. ACM, (2012)Industrial evaluation of pairwise SPL testing with MoSo-PoLiTe.M. Steffens, S. Oster, M. Lochau, and T. Fogdal. VaMoS, page 55-62. ACM, (2012)Modeling and Testing Product Lines with Unbounded Parametric Real-Time Constraints.L. Luthmann, A. Stephan, J. Bürdek, and M. Lochau. SPLC (A), page 104-113. ACM, (2017)Fault-based product-line testing: effective sample generation based on feature-diagram mutation.D. Reuling, J. Bürdek, S. Rotärmel, M. Lochau, and U. Kelter. SPLC, page 131-140. ACM, (2015)