PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Hsu, Chun-Kai"

Author of the publication

copydeleteadd this publication to your clipboard
Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs.

, , , , and . ASP-DAC, page 429-434. IEEE, (2013)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Univ. -Prof. Dr. -Ing. Kai Hufendiek University of Stuttgart

Kai Waldner University of Stuttgart

Dr. Florian Kaiser University of Stuttgart

Phi-Long Chung University of Stuttgart

Manuel Kaiser University of Stuttgart

 

Other publications of authors with the same name

Processor and DRAM integration by TSV-based 3-D stacking for power-aware SOCs., , , , and . ASP-DAC, page 429-434. IEEE, (2013)Joint Virtual Probe: Joint exploration of multiple test items' spatial patterns for efficient silicon characterization and test prediction., , , , and . DATE, page 1-6. European Design and Automation Association, (2014)Sparse Coding Based Music Genre Classification Using Spectro-Temporal Modulations., , and . ISMIR, page 744-750. (2016)Learning from Production Test Data: Correlation Exploration and Feature Engineering., , and . ATS, page 236-241. IEEE Computer Society, (2014)Neural Network Based Next-Song Recommendation., , , and . CoRR, (2016)Estimates of Bridge Girder Conditions Based on Fuzzy Inspection Data., , , and . FSKD (3), page 537-540. IEEE Computer Society, (2008)978-0-7695-3305-6.Pairwise Proximity-Based Features for Test Escape Screening., , , and . ICCAD, page 300-306. IEEE, (2015)AdaTest: An efficient statistical test framework for test escape screening., , and . ITC, page 1-8. IEEE, (2015)Pavement performance prediction through fuzzy regression., , , and . Expert Syst. Appl., 38 (8): 10010-10017 (2011)Variation and failure characterization through pattern classification of test data from multiple test stages., , , , , , and . ITC, page 1-10. IEEE, (2016)