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A Low Cost Multi-Tiered Approach to Improving the Reliability of Multi-Level Cell Pram.

, , , , , and . Signal Processing Systems, 76 (2): 133-147 (2014)

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Hierarchical modeling of Phase Change memory for reliable design., , , , and . ICCD, page 115-120. IEEE Computer Society, (2012)Improving reliability of non-volatile memory technologies through circuit level techniques and error control coding., , , and . EURASIP J. Adv. Sig. Proc., (2012)Product Code Schemes for Error Correction in MLC NAND Flash Memories., , and . IEEE Trans. VLSI Syst., 20 (12): 2302-2314 (2012)Stochastic Parameterization to Represent Variability and Extremes in Climate Modeling., , , , , , , , , and . ICCS, volume 29 of Procedia Computer Science, page 1146-1155. Elsevier, (2014)Improving the Reliability of MLC NAND Flash Memories Through Adaptive Data Refresh and Error Control Coding., , , and . Signal Processing Systems, 76 (3): 225-234 (2014)A Low Cost Multi-Tiered Approach to Improving the Reliability of Multi-Level Cell Pram., , , , , and . Signal Processing Systems, 76 (2): 133-147 (2014)Enhancing the Reliability of STT-RAM through Circuit and System Level Techniques., , , , and . SiPS, page 125-130. IEEE, (2012)A primal-dual algorithm for the minimum average weighted length circuit problem., and . Networks, 21 (7): 705-712 (1991)Flexible product code-based ECC schemes for MLC NAND Flash memories., , , and . SiPS, page 255-260. IEEE, (2011)Multi-Tiered Approach to Improving the Reliability of Multi-Level Cell PRAM., , , and . SiPS, page 114-119. IEEE, (2012)