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Cold Delay Defect Screening., , , and . VTS, page 183-188. IEEE Computer Society, (2000)MINVDD Testing for Weak CMOS ICs., , , and . VTS, page 339-345. IEEE Computer Society, (2001)Stuck-fault tests vs. actual defects., and . ITC, page 336-343. IEEE Computer Society, (2000)Complex sensing event process of IoT application based on epcglobal architecture and IEEE 1451., , and . IOT, page 92-98. IEEE, (2012)An Evaluation of Pseudo Random Testing for Detecting Real Defects., , , and . VTS, page 404-410. IEEE Computer Society, (2001)Analysis of pattern-dependent and timing-dependent failures in an experimental test chip., , , , and . ITC, page 184-193. IEEE Computer Society, (1998)Multiple-output propagation transition fault test., and . ITC, page 358-366. IEEE Computer Society, (2001)Adding IEEE 1451 Transducer Capability to EPCglobal Information Service., , and . iThings/GreenCom/CPSCom, page 264-271. IEEE Computer Society, (2014)Effective and Economic Phase Noise Testing for Single-Chip TV Tuners., , , , and . IEEE Trans. Instrumentation and Measurement, 57 (10): 2265-2272 (2008)ELF-Murphy Data on Defects and Test Sets., , , , , , , and . VTS, page 16-22. IEEE Computer Society, (2004)