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Disambiguation of "Vermeulen, Bart"

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Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip.

, , and . NOCS, page 3-12. IEEE Computer Society, (2008)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Rahul Barthwal University of Stuttgart

Lukas Bartholomäus University of Stuttgart

Dr. rer. nat. Simon Barth University of Stuttgart

Aneesh Barthakur University of Stuttgart

Alexander Bartler University of Stuttgart

 

Other publications of authors with the same name

Optimal scheduling of switched FlexRay networks., , and . DATE, page 926-931. IEEE, (2011)Webcams for Bird Detection and Monitoring: A Demonstration Study., , , , , , and . Sensors, 10 (4): 3480-3503 (2010)Debugging Distributed-Shared-Memory Communication at Multiple Granularities in Networks on Chip., , and . NOCS, page 3-12. IEEE Computer Society, (2008)Overview of Debug Standardization Activities., , , , and . IEEE Design & Test of Computers, 25 (3): 258-267 (2008)On-chip Scan-Based Test Strategy for a Dependable Many-Core Processor Using a NoC as a Test Access Mechanism., , and . DSD, page 531-537. IEEE Computer Society, (2010)New scan-based test strategy for a dependable many-core processor using a NoC as a Test Access Mechanism., , and . European Test Symposium, page 243. IEEE Computer Society, (2010)Xetal-II: A 107 GOPS, 600 mW Massively Parallel Processor for Video Scene Analysis., , , , , , , and . J. Solid-State Circuits, 43 (1): 192-201 (2008)Component-Level ASIL Decomposition for Automotive Architectures., , and . DSN Workshops, page 62-69. IEEE, (2019)Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?, , , , , , and . VTS, page 445-446. IEEE Computer Society, (2002)A distributed architecture to check global properties for post-silicon debug., , and . European Test Symposium, page 182-187. IEEE Computer Society, (2010)