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A scan disabling-based BAST scheme for test cost reduction., , , , and . IEICE Electronic Express, 8 (16): 1367-1373 (2011)Single Event Transient Propagation Probabilities Analysis for Nanometer CMOS Circuits., , , and . J. Electronic Testing, 35 (2): 163-172 (2019)Low power logic BIST with high test effectiveness., , , and . IEICE Electronic Express, 10 (23): 20130853 (2013)A scan disabling-based BAST scheme for test cost and test power reduction., , , , and . IEICE Electronic Express, 9 (2): 111-116 (2012)A Secure DFT Architecture Protecting Crypto Chips Against Scan-Based Attacks., , , , and . IEEE Access, (2019)DOA tracking for seamless connectivity in beamformed IoT-based drones., , , , , and . Comput. Stand. Interfaces, (2022)Achieving low capture and shift power in linear decompressor-based test compression environment., , and . Microelectronics Journal, 43 (2): 134-140 (2012)On the concatenation of turbo codes and Reed-Solomon codes., , , , , , and . ICC, page 2134-2138. IEEE, (2003)Enhancing Security of FPGA-Based Embedded Systems with Combinational Logic Binding., , , and . J. Comput. Sci. Technol., 32 (2): 329-339 (2017)Leveraging Smart Lights for Passive Localization., , , and . MASS, page 272-280. IEEE Computer Society, (2018)