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Disambiguation of "Kang, Bongkoo"

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Influence of wall charge on image sticking phenomena in AC plasma display panels.

, , , , , and . Displays, 30 (1): 39-43 (2009)

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M.Sc Yeonse Kang University of Stuttgart

 

Other publications of authors with the same name

Influence of wall charge on image sticking phenomena in AC plasma display panels., , , , , and . Displays, 30 (1): 39-43 (2009)Channel width dependence of mechanical stress effects induced by shallow trench isolation on device performance of nanoscale nMOSFETs., , , , , and . Microelectronics Reliability, 52 (9-10): 1949-1952 (2012)Power-efficient drive circuit for plasma display panel., , , , , and . Displays, 35 (2): 66-73 (2014)Method of controlling external electrode fluorescent lamps for local dimming of liquid crystal displays., , , and . Displays, 32 (3): 142-149 (2011)Active Balancing of Li-Ion Battery Cells Using Transformer as Energy Carrier., , , and . IEEE Trans. Industrial Electronics, 64 (2): 1251-1257 (2017)Effect of negative bias temperature instability induced by a low stress voltage on nanoscale high-k/metal gate pMOSFETs., , , , , , and . Microelectronics Reliability, 53 (9-11): 1351-1354 (2013)Enhanced degradation of n-MOSFETs with high-k/metal gate stacks under channel hot-carrier/gate-induced drain leakage alternating stress., , , , , and . Microelectronics Reliability, 52 (9-10): 1901-1904 (2012)Voltage dependent degradation of HfSiON/SiO2 nMOSFETs under positive bias temperature instability., , and . Microelectronics Reliability, 54 (11): 2383-2387 (2014)Degradation of pMOSFETs due to hot electron induced punchthrough., , , , , and . Microelectronics Reliability, (2016)Modularized Design of Active Charge Equalizer for Li-Ion Battery Pack., , , and . IEEE Trans. Industrial Electronics, 65 (11): 8697-8706 (2018)