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Molecular dynamics simulations studies of laser ablation in metals, , , , , , and . AIP Conf. Proc., 1464, (2012)Distributed Test Pattern Generation for Stuck-At Faults in Sequential Circuits., , and . J. Electronic Testing, 11 (3): 227-245 (1997)Parallelisierung der automatischen Testmustergenerierung in sequentiellen Schaltungen.. Technical University Munich, Germany, (1995)Entwicklung eines standardisierten Ansatzes zur Klassifizierung von Verteilnetzen, , , , and . Smart cities : intelligente Lösungen für das Leben in der Zukunft : VDE-Kongress 2014, Berlin, VDE Verlag, (2014)Systematischer Entwurf von Mikroprozessorschaltungen.. it - Informationstechnik, 28 (4): 249-256 (1986)Application of Fault Parallelism to the Automatic Test Pattern Generation for Sequential Circuits., and . Parallel Computer Architectures, volume 732 of Lecture Notes in Computer Science, page 234-245. Springer, (1993)A Distributed Automatic Test Pattern Generation System.. HPCN, volume 796 of Lecture Notes in Computer Science, page 105-110. Springer, (1994)