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Partially programmable circuit design., , , and . EWDTS, page 1-4. IEEE Computer Society, (2014)Multiple stuck-at fault testability of a combinational circuit derived by covering ROBDD nodes by Invert-And-Or sub-circuits., , and . EWDTS, page 1-4. IEEE Computer Society, (2015)Self-Checking FSM Design with Observing only FSM Outputs., and . IOLTW, page 153-154. IEEE Computer Society, (2000)Selection of the state variables for partial enhanced scan techniques., , , and . EWDTS, page 285-290. IEEE Computer Society, (2011)Path delay faults and ENF., , , and . EWDTS, page 164-167. IEEE Computer Society, (2010)ROBDD based path delay fault testable combinational circuit synthesis., , and . EWDTS, page 1-4. IEEE, (2016)ROBDDs application for finding the shortest transfer sequence of sequential circuit or only revealing existence of this sequence without deriving the sequence itself., , and . EWDTS, page 1-4. IEEE, (2016)Combinational part structure simplification of fully delay testable sequential circuit., , and . EWDTS, page 1-5. IEEE Computer Society, (2014)Fully delay and multiple stuck-at faults testable FSM design., , and . EWDTS, page 1-4. IEEE Computer Society, (2015)Survivable Discrete Circuits Design., , and . IOLTW, page 13-. IEEE Computer Society, (2002)