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Logic simulation and fault analysis of a self-checking switching processor.

, , and . DAC, page 128-137. ACM, (1972)

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Engineering design aspects., and . DAC, page 370-373. ACM/IEEE, (1984)Deductive Techniques for Simulating Logic Circuits., and . IEEE Computer, 8 (3): 52-59 (1975)An Algorithm for Selecting an Optimum Set of Diagnostic Tests.. IEEE Trans. Electronic Computers, 14 (5): 706-711 (1965)R70-41 Diagnosis and Utilization of Faulty Universal Tree Circuits.. IEEE Trans. Computers, 19 (10): 988-989 (1970)Logic simulation and fault analysis of a self-checking switching processor., , and . DAC, page 128-137. ACM, (1972)A distinguishability criterion for selecting efficient diagnostic tests.. AFIPS Spring Joint Computing Conference, volume 32 of AFIPS Conference Proceedings, page 529-534. Thomson Book Company, Washington D.C., (1968)