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Smart selection of indirect parameters for DC-based alternate RF IC testing.

, , , , , , , and . VTS, page 19-24. IEEE Computer Society, (2012)

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Änalogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC., , , , , and . European Test Symposium, page 211-216. IEEE Computer Society, (2007)A Low Cost Alternative Method for Harmonics Estimation in a BIST Context., , , , , , , and . European Test Symposium, page 193-198. IEEE Computer Society, (2006)A phantom axon setup for validating models of action potential recordings., , , , and . Med. Biol. Engineering and Computing, 54 (8): 1257-1267 (2016)Exploring the limit of ENG spatio-temporal filtering for velocity-selectivity., , , , and . NER, page 585-588. IEEE, (2015)Fascicle-selective multi-contact cuff electrode., , , , and . EMBC, page 2989-2992. IEEE, (2011)Wireless Test Structure for Integrated Systems., , , , and . ITC, page 1. IEEE Computer Society, (2008)A Low-Cost BIST Architecture for Linear Histogram Testing of ADCs., , , and . J. Electronic Testing, 17 (2): 139-147 (2001)On-Chip Generation of Ramp and Triangle-Wave Stimuli for ADC BIST., , , and . J. Electronic Testing, 19 (4): 469-479 (2003)Efficiency of Optimized Dynamic Test Flows for ADCs: Sensitivity to Specifications., , , , and . J. Electronic Testing, 21 (3): 291-298 (2005)Digital Test Method for Embedded Converters with Unknown-Phase Harmonics., , , , , and . J. Electronic Testing, 27 (3): 335-350 (2011)