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ASIC implementation of a hardware-embedded physical unclonable function.

, , , and . IET Computers & Digital Techniques, 8 (6): 288-299 (2014)

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Digital Integrated Circuit Testing using Transient Signal Analysis., , and . ITC, page 481-490. IEEE Computer Society, (1996)Power supply transient signal integration circuit., , and . ITC, page 704-712. IEEE Computer Society, (2001)Characterization of CMOS Defects using Transient Signal Analysis., , and . DFT, page 93-101. IEEE Computer Society, (1998)Power supply transient signal analysis for defect-oriented test., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 22 (3): 370-374 (2003)Detection of CMOS Defects under Variable Processing Conditions., and . VTS, page 195-204. IEEE Computer Society, (2000)Identification of Defective CMOS Devices Using Correlation and Regression Analysis of Frequency Domain Transient Signal Data., , and . ITC, page 40-49. IEEE Computer Society, (1997)8-Bit Multiplier Simulation Experiments Investigating the Use of Power Supply Transient Signals for the Detection of CMOS Defects., , and . DFT, page 68-76. IEEE Computer Society, (1999)Detecting delay faults using power supply transient signal analysis., , , , and . ITC, page 395-404. IEEE Computer Society, (2001)A Comparitive Study of W-cdma Cell Search Designs., , and . Journal of Circuits, Systems, and Computers, 14 (1): 129-136 (2005)A Sensitivity Analysis of Power Signal Methods for Detecting Hardware Trojans Under Real Process and Environmental Conditions., , and . IEEE Trans. VLSI Syst., 18 (12): 1735-1744 (2010)