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FakeSpotter: A Simple yet Robust Baseline for Spotting AI-Synthesized Fake Faces.

R. Wang, F. Juefei-Xu, L. Ma, X. Xie, Y. Huang, J. Wang, and Y. Liu. IJCAI, page 3444-3451. ijcai.org, (2020)Scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic..

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Xu Chu

Fuchs Felix University of Stuttgart

Chensheng Xu University of Stuttgart

Tongyu Xu University of Stuttgart

Yichen Xu University of Stuttgart

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An image statistics approach towards efficient and robust refinement for landmarks on facial boundary.F. Juefei-Xu, and M. Savvides. BTAS, page 1-8. IEEE, (2013)Secure Deep Learning Engineering: A Software Quality Assurance Perspective.L. Ma, F. Juefei-Xu, M. Xue, Q. Hu, S. Chen, B. Li, Y. Liu, J. Zhao, J. Yin, and S. See. CoRR, (2018)Discriminative Invariant Kernel Features: A Bells-and-Whistles-Free Approach to Unsupervised Face Recognition and Pose Estimation.D. Pal, F. Juefei-Xu, and M. Savvides. CVPR, page 5590-5599. IEEE Computer Society, (2016)FakeSpotter: A Simple yet Robust Baseline for Spotting AI-Synthesized Fake Faces.R. Wang, F. Juefei-Xu, L. Ma, X. Xie, Y. Huang, J. Wang, and Y. Liu. IJCAI, page 3444-3451. ijcai.org, (2020)Scheduled for July 2020, Yokohama, Japan, postponed due to the Corona pandemic..Deepmix: Online Auto Data Augmentation for Robust Visual Object Tracking.Z. Cheng, X. Ren, F. Juefei-Xu, W. Xue, Q. Guo, L. Ma, and J. Zhao. ICME, page 1-6. IEEE, (2021)Encoding and decoding local binary patterns for harsh face illumination normalization.F. Juefei-Xu, and M. Savvides. ICIP, page 3220-3224. IEEE, (2015)Single face image super-resolution via solo dictionary learning.F. Juefei-Xu, and M. Savvides. ICIP, page 2239-2243. IEEE, (2015)Simultaneous forgery identification and localization in paintings using advanced correlation filters.P. Buchana, I. Cazan, M. Diaz-Granados, F. Juefei-Xu, and M. Savvides. ICIP, page 146-150. IEEE, (2016)Local Binary Convolutional Neural Networks.F. Juefei-Xu, V. Boddeti, and M. Savvides. CoRR, (2016)Bias Field Poses a Threat to DNN-Based X-Ray Recognition.B. Tian, Q. Guo, F. Juefei-Xu, W. Chan, Y. Cheng, X. Li, X. Xie, and S. Qin. ICME, page 1-6. IEEE, (2021)