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Resident Evil: Understanding Residential IP Proxy as a Dark Service.

X. Mi, X. Feng, X. Liao, B. Liu, X. Wang, F. Qian, Z. Li, S. Alrwais, L. Sun, and Y. Liu. IEEE Symposium on Security and Privacy, page 1185-1201. IEEE, (2019)

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Dexing Liu University of Stuttgart

Jan Liu University of Stuttgart

M.Sc. Zhuoran Liu University of Stuttgart

Yanchao Liu University of Stuttgart

Shuang Liu University of Stuttgart

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Cracking the Wall of Confinement: Understanding and Analyzing Malicious Domain Take-downs.E. Alowaisheq, P. Wang, S. Alrwais, X. Liao, X. Wang, T. Alowaisheq, X. Mi, S. Tang, and B. Liu. NDSS, The Internet Society, (2019)On-chip readout circuit for nanomagnetic logic.B. Liu, L. Cai, J. Zhu, Q. Kang, M. Zhang, and X. Chen. IET Circuits, Devices & Systems, 8 (1): 65-72 (2014)A Reexamination of Internationalized Domain Names: The Good, the Bad and the Ugly.B. Liu, C. Lu, Z. Li, Y. Liu, H. Duan, S. Hao, and Z. Zhang. DSN, page 654-665. IEEE Computer Society, (2018)TraffickStop: Detecting and Measuring Illicit Traffic Monetization Through Large-Scale DNS Analysis.B. Liu, Z. Liu, P. Zong, C. Lu, H. Duan, Y. Liu, S. Alrwais, X. Wang, S. Hao, Y. Jia and 3 other author(s). EuroS&P, page 560-575. IEEE, (2019)Don't Let One Rotten Apple Spoil the Whole Barrel: Towards Automated Detection of Shadowed Domains.D. Liu, Z. Li, K. Du, H. Wang, B. Liu, and H. Duan. ACM Conference on Computer and Communications Security, page 537-552. ACM, (2017)Who Is Answering My Queries: Understanding and Characterizing Interception of the DNS Resolution Path.B. Liu, C. Lu, H. Duan, Y. Liu, Z. Li, S. Hao, and M. Yang. USENIX Security Symposium, page 1113-1128. USENIX Association, (2018)Reliability Evaluation for Single Event Transients on Digital Circuits.B. Liu, and L. Cai. IEEE Trans. Reliability, 61 (3): 687-691 (2012)Total Ionizing Dose Hardening of 45 nm FD-SOI MOSFETs Using Body-Tie Biasing.X. Liu, L. Cai, B. Liu, X. Yang, H. Cui, and C. Li. IEEE Access, (2019)Resident Evil: Understanding Residential IP Proxy as a Dark Service.X. Mi, X. Feng, X. Liao, B. Liu, X. Wang, F. Qian, Z. Li, S. Alrwais, L. Sun, and Y. Liu. IEEE Symposium on Security and Privacy, page 1185-1201. IEEE, (2019)The impact of Miller and coupling effects on single event transient in logical circuits.B. Liu, L. Cai, X. Yang, H. Huang, P. Bai, and W. Peng. Microelectronics Journal, 43 (1): 63-68 (2012)