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A voltage drop aware crosstalk measurement with multi-aggressors in 65nm process., , , and . CICC, page 37-40. IEEE, (2008)Assessment of reliability impact on GHz processors with moderate overdrive., , , , and . ISQED, page 456-460. IEEE, (2014)Spatial Distribution Measurement of Dynamic Voltage Drop Caused by Pulse and Periodic Injection of Spot Noise., , , , , and . IEEE Trans. VLSI Syst., 21 (1): 164-168 (2013)Novel Tactile Sensors Manufactured by Carbon Microcoils., , , , , and . ICMENS, page 486-491. IEEE Computer Society, (2004)Experimental Implementation of 8.9Kgate Stress Monitor in 28nm MCU Along with Safety Software Library for IoT Device Maintenance., , , , , , , , , and . IRPS, page 1-7. IEEE, (2019)An on-die digital aging monitor against HCI and xBTI in 16 nm Fin-FET bulk CMOS technology., , , , , and . ESSCIRC, page 112-115. IEEE, (2015)28-nm HKMG GHz digital sensor for detecting dynamic voltage drops in testing for peak power optimization., , , , and . CICC, page 1-4. IEEE, (2012)Non-parametric test of time consistency: Present bias and future bias.. Games and Economic Behavior, 71 (2): 456-478 (2011)Multi-object auctions with package bidding: An experimental comparison of Vickrey and iBEA., and . Games and Economic Behavior, 68 (2): 557-579 (2010)Observations of Supply-Voltage-Noise Dispersion in Sub-nsec., , , , , and . ITC, page 1-8. IEEE Computer Society, (2008)