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Disambiguation of "Ker, Ming-Dou"

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A fully integrated 8-channel closed-loop neural-prosthetic SoC for real-time epileptic seizure control.

, , , , , , , , , , , , , , , , , , , , , , and . ISSCC, page 286-287. IEEE, (2013)

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Dr. Karim Douch University of Stuttgart

Dr. Michal Kern University of Stuttgart

Akram Keramat University of Stuttgart

apl. Prof. Dr. Frank Kern University of Stuttgart

Mira Kern University of Stuttgart

 

Other publications of authors with the same name

Electrostatic discharge protection scheme without leakage current path for CMOS IC operating in power-down-mode condition on a system board., and . Microelectronics Reliability, 46 (2-4): 301-310 (2006)Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation., and . Microelectronics Reliability, 50 (1): 48-56 (2010)PMOS-based power-rail ESD clamp circuit with adjustable holding voltage controlled by ESD detection circuit., and . Microelectronics Reliability, 53 (2): 208-214 (2013)ESD protection design for CMOS RF integrated circuits using polysilicon diodes., and . Microelectronics Reliability, 42 (6): 863-872 (2002)Metal-layer capacitors in the 65 nm CMOS process and the application for low-leakage power-rail ESD clamp circuit., and . Microelectronics Reliability, 54 (1): 64-70 (2014)New Curvature-Compensation Technique for CMOS Bandgap Reference With Sub-1-V Operation., and . IEEE Trans. on Circuits and Systems, 53-II (8): 667-671 (2006)Overview on electrostatic discharge protection designs for mixed-voltage I/O interfaces: design concept and circuit implementations., and . IEEE Trans. on Circuits and Systems, 53-I (2): 235-246 (2006)Circuit Performance Degradation of Switched-Capacitor Circuit with Bootstrapped Technique due to Gate-Oxide Overstress in a 130-nm CMOS Process., and . IEICE Transactions, 91-C (3): 378-384 (2008)System-Level ESD Protection Design with On-Chip Transient Detection Circuit., , and . ICECS, page 616-619. IEEE, (2006)CMOS Power Amplifier with ESD Protection Design Merged in Matching Network., , and . ICECS, page 825-828. IEEE, (2007)