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Disambiguation of "Stoppa, David"

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A Time-Resolved, Low-Noise Single-Photon Image Sensor Fabricated in Deep-Submicron CMOS Technology.

, , , , , , , , and . J. Solid-State Circuits, 47 (6): 1394-1407 (2012)

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Dr. Marie Davidova University of Stuttgart

David Inkermann

David Briesenick University of Stuttgart

David Gudnason University of Stuttgart

David Stieler University of Stuttgart

 

Other publications of authors with the same name

Design of electro-optical demodulating pixel in CMOS technology., , , , , and . ISCAS (1), page 572-575. IEEE, (2005)3D camera based on linear-mode gain-modulated avalanche photodiodes., , , , and . ISSCC, page 490-491. IEEE, (2013)An 8×16-pixel 92kSPAD time-resolved sensor with on-pixel 64ps 12b TDC and 100MS/s real-time energy histogramming in 0.13µm CIS technology for PET/MRI applications., , , , , , , and . ISSCC, page 486-487. IEEE, (2013)16.3 A 16×16 pixels SPAD-based 128-Mb/s quantum random number generator with -74dB light rejection ratio and -6.7ppm/°C bias sensitivity on temperature., , , , , , , and . ISSCC, page 292-293. IEEE, (2016)11.3 A 160×120-pixel analog-counting single-photon imager with Sub-ns time-gating and self-referenced column-parallel A/D conversion for fluorescence lifetime imaging., , , , and . ISSCC, page 1-3. IEEE, (2015)A 30-ns recovery time, 11.5-nC input charge range, 16-channel read-out ASIC for PET application., , , , , and . ESSCIRC, page 360-363. IEEE, (2015)A fast and low power CMOS sensor for optical tracking., , , , , and . ISCAS (4), page 796-799. IEEE, (2003)Sensors optimized for 3-D digitization., , , , and . IEEE Trans. Instrumentation and Measurement, 52 (3): 903-908 (2003)A 64 × 64-Pixels Digital Silicon Photomultiplier Direct TOF Sensor With 100-MPhotons/s/pixel Background Rejection and Imaging/Altimeter Mode With 0.14% Precision Up To 6 km for Spacecraft Navigation and Landing., , and . J. Solid-State Circuits, 52 (1): 151-160 (2017)A high-gain, low-noise switched capacitor readout for FET-based THz detectors., , and . ESSCIRC, page 401-404. IEEE, (2016)