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Advancing blood glucose prediction with neural architecture search and deep reinforcement learning for type 1 diabetics

, , , , , and . Biocybernetics and Biomedical Engineering, 44 (3): 481--500 (2024)

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Advancing blood glucose prediction with neural architecture search and deep reinforcement learning for type 1 diabetics, , , , , and . Biocybernetics and Biomedical Engineering, 44 (3): 481--500 (2024)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), page 969-974. Piscataway, IEEE, (2022)Training Large Language Models for System-Level Test Program Generation Targeting Non-functional Properties, , , , , , and . 2024 IEEE European Test Symposium (ETS), IEEE, (2024)Self-Learning Tuning for Post-Silicon Validation, , , and . Preprint, (2022)hws: A Tool for Monitoring Hardware Metrics Across Diverse Vendors: A Case Study on Hyperparameter Optimization Algorithms, , , and . SC24-W: Workshops of the International Conference for High Performance Computing, Networking, Storage and Analysis, page 1815--1825. IEEE, (2024)Intelligent Methods for Test and Reliability, , , , , , , , , and 25 other author(s). 2022 Design, Automation & Test in Europe Conference & Exhibition, DATE 2022, Antwerp, Belgium, March 14-23, 2022, page 969--974. IEEE, (2022)Advancing blood glucose prediction with neural architecture search and deep reinforcement learning for type 1 diabetics, , , , , and . Biocybernetics and biomedical engineering, (2024)ML-TIME : ML-driven Timing Analysis of Integrated Circuits in the Presence of Process Variations and Aging Effects, , , and . MLCAD '24 : Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, page 30. New York, Association for Computing Machinery, (2024)ChipMnd: LLMs for Agile Chip Design, , , , , , , , and . 2025 IEEE 43rd VLSI Test Symposium (VTS), page 1--10. IEEE, (2025)Large Language Model-Based Optimization for System-Level Test Program Generation, , , , , , and . 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), page 1--6. IEEE, (2024)