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Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis.

, , , and . IEICE Transactions, 97-C (4): 280-288 (2014)

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Application of Correlation-Based Regression Analysis for Improvement of Power Distribution Network., , , and . IEICE Transactions, 91-A (4): 951-956 (2008)Robust importance sampling for efficient SRAM yield analysis., , , and . ISQED, page 15-21. IEEE, (2010)Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits., , and . IEICE Transactions, 92-A (4): 1031-1038 (2009)Hypersphere Sampling for Accelerating High-Dimension and Low-Failure Probability Circuit-Yield Analysis., , , and . IEICE Transactions, 97-C (4): 280-288 (2014)Improvement of power distribution network using correlation-based regression analysis., , , and . ACM Great Lakes Symposium on VLSI, page 513-516. ACM, (2007)Linear Time Calculation of On-Chip Power Distribution Network Capacitance Considering State-Dependence., , , , and . IEICE Transactions, 93-A (12): 2409-2416 (2010)Sequential importance sampling for low-probability and high-dimensional SRAM yield analysis., , , , and . ICCAD, page 703-708. IEEE, (2010)A MOS Transistor-Array for Accurate Measurement of Subthreshold Leakage Variation., , , , , , and . ISQED, page 21-26. IEEE Computer Society, (2007)Linear time calculation of state-dependent power distribution network capacitance., , , , and . ISQED, page 75-80. IEEE, (2010)State-Dependence of On-Chip Power Distribution Network Capacitance., , , , and . IEICE Transactions, 97-C (1): 77-84 (2014)