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Impact of conventional and microwave heating on SAPO-5 formation and Brønsted acidic properties

T. Dang, D. Hoang, M. Schneider, M. Hunger, and A. Martin. Zeitschrift für anorganische und allgemeine Chemie, 640 (8/9): 1576-1584 (2014)
DOI: 10.1002/zaac.201400014

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Martin Markert University of Stuttgart

Einfluss von RC-Gesteinskörnung auf das Druckkriechen eines hochfesten BetonsM. Markert, and H. Garrecht. ce/papers, 6 (6): 984-990 (2023)

Martin Baumann

Martin Schwartz University of Stuttgart

Martin Alvarez University of Stuttgart

Univ. -Prof. Martin Ostermann University of Stuttgart

Other publications of authors with the same name

Editorial.A. Martin. Microelectronics Reliability, 41 (7): 935 (2001)A Case Modelling Language for Process Variant Management in Case-Based Reasoning.R. Cognini, K. Hinkelmann, and A. Martin. Business Process Management Workshops, volume 256 of Lecture Notes in Business Information Processing, page 30-42. Springer, (2015)Industry 4.0 Enabling Smart Air: Digital Transformation at KAESER COMPRESSORS.M. Bock, M. Wiener, R. Gronau, and A. Martin. Digitalization Cases, Springer, (2019)Learning and Engineering Similarity Functions for Business Recommenders and Clustering.H. Witschel, and A. Martin. AAAI Spring Symposium: Combining Machine Learning with Knowledge Engineering, volume 2350 of CEUR Workshop Proceedings, CEUR-WS.org, (2019)Training and Re-using Human Experience: A Recommender for More Accurate Cost Estimates in Project Planning.C. von Rohr, H. Witschel, and A. Martin. KMIS, page 50-60. SciTePress, (2018)Towards an Assistive and Pattern Learning-driven Process Modeling Approach.E. Laurenzi, K. Hinkelmann, S. Jüngling, D. Montecchiari, C. Pande, and A. Martin. AAAI Spring Symposium: Combining Machine Learning with Knowledge Engineering, volume 2350 of CEUR Workshop Proceedings, CEUR-WS.org, (2019)Quality assessment of thin oxides using constant and ramped stress measurements.G. Diestel, A. Martin, M. Kerber, A. Schlemm, H. Erlenmaier, B. Murr, and A. Preussger. Microelectronics Reliability, 41 (7): 1019-1022 (2001)An introduction to fast wafer level reliability monitoring for integrated circuit mass production.A. Martin, and R. Vollertsen. Microelectronics Reliability, 44 (8): 1209-1231 (2004)Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process.A. Martin, R. Vollertsen, A. Mitchell, M. Traving, D. Beckmeier, and H. Nielen. Microelectronics Reliability, (2016)A Collaborative Approach to Maturing Process-Related Knowledge.H. Witschel, B. Hu, U. Riss, B. Thönssen, R. Brun, A. Martin, and K. Hinkelmann. BPM, volume 6336 of Lecture Notes in Computer Science, page 343-358. Springer, (2010)