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Influence of Bit Line Twisting on the Faulty Behavior of DRAMs.

, , , and . MTDT, page 32-37. IEEE Computer Society, (2004)

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Univ. -Prof. Dr. Joris van Slageren University of Stuttgart

Electrocatalytic proton reduction: Metal based fused diporphyrins with proton relays for efficient catalysis, , , , , , , , and . Dataset, (2024)Related to: Chandra, S., Singha Hazari, A., Song, Q., Hunger, D., Neuman, N. I., van Slageren, J., Klemm, E. & Sarkar, B. (2023). Remarkable Enhancement of Catalytic Activity of Cu-Complexes in the Electrochemical Hydrogen Evolution Reaction by Using Triply Fused Porphyrin. ChemSusChem 16, e202201146. doi: 10.1002/cssc.202201146.
 

Other publications of authors with the same name

Industrial evaluation of stress combinations for march tests applied to SRAMs., and . ITC, page 983-992. IEEE Computer Society, (1999)Consequences of port restrictions on testing two-port memories., and . ITC, page 63-72. IEEE Computer Society, (1998)Semiconductor manufacturing process monitoring using built-in self-test for embedded memories., , , , and . ITC, page 872-881. IEEE Computer Society, (1998)An Industrial Evaluation of DRAM Tests.. IEEE Design & Test of Computers, 21 (5): 430-440 (2004)Automatic fault localization at chip level., , and . Microprocessors and Microsystems - Embedded Hardware Design, 22 (1): 13-22 (1998)Static and dynamic behavior of memory cell array opens and shorts in embedded DRAMs., and . DATE, page 496-503. IEEE Computer Society, (2001)Minimal Test for Coupling Faults in Word-Oriented Memories., , and . DATE, page 944-948. IEEE Computer Society, (2002)Disturb Neighborhood Pattern Sensitive Fault., and . VTS, page 37-47. IEEE Computer Society, (1997)A Fault Primitive Based Analysis of Linked Faults in RAMs., , and . MTDT, page 33-. IEEE Computer Society, (2003)Influence of Bit Line Twisting on the Faulty Behavior of DRAMs., , , and . MTDT, page 32-37. IEEE Computer Society, (2004)