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Scan Tests with Multiple Fault Activation Cycles for Delay Faults.

, , , , and . VTS, page 343-348. IEEE Computer Society, (2006)

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Vector-Based Functional Fault Models for Delay Faults., and . Asian Test Symposium, page 41-46. IEEE Computer Society, (1999)Fault Diagnosis under Transparent-Scan., and . Asian Test Symposium, page 29-34. IEEE Computer Society, (2009)A Diagnostic Test Generation Procedure for Combinational Circuits Based on Test Elimination., and . Asian Test Symposium, page 486-491. IEEE Computer Society, (1998)An Efficient Method to Identify Untestable Path Delay Faults., , , and . Asian Test Symposium, page 233-238. IEEE Computer Society, (2001)Circuit Independent Weighted Pseudo-Random BIST Pattern Generator., , and . Asian Test Symposium, page 132-137. IEEE Computer Society, (2005)Test Data Compression Using Don?t-Care Identification and Statistical Encoding., , , , and . Asian Test Symposium, page 67-. IEEE Computer Society, (2002)On Generating High Quality Tests for Transition Faults., , and . Asian Test Symposium, page 1. IEEE Computer Society, (2002)Weighted Pseudo-Random BIST for N-Detection of Single Stuck-at Faults., , and . Asian Test Symposium, page 178-183. IEEE Computer Society, (2004)Built-in generation of multi-cycle broadside tests.. DFT, page 146-151. IEEE Computer Society, (2012)A-Diagnosis: A Complement to Z-Diagnosis., and . DFT, page 235-242. IEEE Computer Society, (2007)