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Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level, , , , , , , , , and 7 other author(s). Sensors, 21 (4): 1103 (2021)Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level, , , , , , , , , and 7 other author(s). Sensors, 21 (4): 1103 (2021)Lens aberration compensation in interference microscopy, , , , , , , and . Optics and Lasers in Engineering, (May 2020)Lens aberration compensation in interference microscopy, , , , , , , and . Optics and Lasers in Engineering, (2020)ICT Use in the Context of Electricity Access in a Developing Country: A Choice Framework Analysis., , , , , , and . ICT4D (1), volume 551 of IFIP Advances in Information and Communication Technology, page 27-38. Springer, (2019)Semi-automated Assembly of a MEMS-Based Micro-scale CMM Probe and Future Optimization of the Process Chain with a View to Desktop Factory Automation., , , and . IPAS, volume 371 of IFIP Advances in Information and Communication Technology, page 9-16. Springer, (2012)Modelling the Interaction Forces between an Ideal Measurement Surface and the Stylus Tip of a Novel Vibrating Micro-scale CMM Probe., , and . IPAS, volume 315 of IFIP Advances in Information and Communication Technology, page 131-138. Springer, (2010)External Shape Measurement for Industrial Applications Using Artificial Intelligence and Optimised Data Fusion., , , , , , , , and . IntelliSys (2), volume 869 of Advances in Intelligent Systems and Computing, page 1273-1281. Springer, (2018)Testing the Mechanical Characteristics and Contacting Behaviour of Novel Manufactured and Assembled Sphere-Tipped Styli for Micro-CMM Probes., , and . IPAS, volume 435 of IFIP Advances in Information and Communication Technology, page 15-21. Springer, (2014)Application of a DFµA Methodology to facilitate the assembly of a Micro/Nano Measurement Device., , , , and . IPAS, volume 260 of IFIP, page 5-12. Springer, (2008)