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Modeling and wafer defect analysis in semiconductor automated material handling systems., , and . Winter Simulation Conference, page 171:1-171:12. WSC, (2012)Simulation based forecast of supermarket sales., , , and . ETFA, page 1-8. IEEE, (2012)Automated planning, execution and evaluation of simulation experiments of semiconductor AMHS., , , and . Winter Simulation Conference, page 3891-3904. IEEE, (2013)Analysis and simulation of sales receipt data in supermarkets., , and . ETFA, page 1-8. IEEE, (2011)Continuous flow transport scheduling for conveyor-based AMHS in wafer fabs., and . WSC, page 3588-3599. IEEE, (2017)Event-based recognition and source identification of transient tailbacks in manufacturing plants., , , and . Winter Simulation Conference, page 271:1-271:12. WSC, (2012)Simulation and analysis of buying behavior in supermarkets., , and . ETFA, page 1-4. IEEE, (2010)Event Based Identification and Prediction of Congestions in Manufacturing Plants., , and . NEW PROLAMAT, volume 411 of IFIP Advances in Information and Communication Technology, page 376-390. Springer, (2013)Large-Scale Scheduling with Routing, Batching and Release Dates for Wafer Fabs using Tabu Search., , and . ETFA, page 472-479. IEEE, (2018)Automated planning and creation of simulation experiments with a domain specific ontology for semiconductor manufacturing AMHS., , , , and . Winter Simulation Conference, page 2628-2639. IEEE/ACM, (2014)