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Schneller sehen durch Regelungstechnik -- Moderne Bildgebung in der Nanotechnologie

, , and . in Wechselwirkungen, pages 100--108, Universität Stuttgart, Germany, (2004)

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High performance feedback for fast scanning atomic force microscopes, , , , and . Review of Scientific Instruments, 72 (8): 3320-3327 (2001)Schneller sehen durch Regelungstechnik -- Moderne Bildgebung in der Nanotechnologie, , and . in Wechselwirkungen, pages 100--108, Universität Stuttgart, Germany, (2004)Robust 2DOF-control of a piezoelectric tube scanner for high speed atomic force microscopy, , and . Proc. American Control Conf. (ACC), page 3720-3725. Denver, CO, USA, (2003)Robust two-degree-of-freedom control of an atomic force microscope, , and . Asian J. Control, 6 (2): 156-163 (2004)Intelligent Control for the next generation of fast scanning atomic force microscopes, , , , and . 8th Workshop on Scanning-probe Microscopy and Organic Materials, Basel, (1999)Simulation and open loop identification of tapping mode atomic force microscopy, , , , and . 3rd International Conference on non-contact AFM, Hamburg, (2000)Control strategies towards faster quantitative imaging in atomic force microscopy, , , and . European J. Control, 11 (4-5): 384-395 (2005)Experimental application of $\ell_1$-optimal control in atomic force microscopy, , , and . Proc. 16th IFAC World Congress, Prague, Czech Republic, (2005)available online http://dx.doi.org/10.3182/20050703-6-CZ-1902.00511.A new control strategy for high-speed atomic force microscopy, , and . Nanotechnology, (2004)