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Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects.

, , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (12): 2039-2048 (2015)

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A Fading Algorithm For Sequential Fault Diagnosis.. DFT, page 139-147. IEEE Computer Society, (2004)On Verifying the Correctness of Retimed Circuits., , and . Great Lakes Symposium on VLSI, page 277-. IEEE Computer Society, (1996)Decomposition of Extended Finite State Machine for Low Power Design., , and . DATE, page 11152-11153. IEEE Computer Society, (2003)Speeding Up The Byzantine Fault Diagnosis Using Symbolic Simulation.. VTS, page 193-200. IEEE Computer Society, (2002)A Light-and-Fast SLAM Algorithm for Robots in Indoor Environments Using Line Segment Map., , , and . J. Robotics, (2011)A novel methodology for transistor-level power estimation., , , and . ISLPED, page 67-72. IEEE, (1996)A fully cell-based design for timing measurement of memory., , , and . ITC, page 1-10. IEEE Computer Society, (2011)High-Performance SIFT Hardware Accelerator for Real-Time Image Feature Extraction., , , and . IEEE Trans. Circuits Syst. Video Techn., 22 (3): 340-351 (2012)Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects., , , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (12): 2039-2048 (2015)General Timing-Aware Built-In Self-Repair for Die-to-Die Interconnects., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (11): 1836-1846 (2015)