Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Jeanneret, Blaise
add a person with the name Jeanneret, Blaise
 

Other publications of authors with the same name

The European ACQHE project: modular system for the calibration of capacitance standards based on the quantum Hall effect., , , , , , , , , and 9 other author(s). IEEE Trans. Instrumentation and Measurement, 52 (2): 563-568 (2003)RLC Bridge Based on an Automated Synchronous Sampling System., and . IEEE Trans. Instrumentation and Measurement, 60 (7): 2393-2398 (2011)Counting electrons one by one-overview of a joint European research project., , , , , , , , , and 15 other author(s). IEEE Trans. Instrumentation and Measurement, 52 (2): 584-589 (2003)Phenomenological Model for Frequency-Related Dissipation in the Quantized Hall Resistance., and . IEEE Trans. Instrumentation and Measurement, 56 (2): 431-434 (2007)A tunable vacuum-gap cryogenic coaxial capacitor., , and . IEEE Trans. Instrumentation and Measurement, 49 (6): 1326-1330 (2000)Comparison EUROMET.EM-K8 of DC voltage ratio: results., , , , , , , , , and 17 other author(s). IEEE Trans. Instrum. Meas., 54 (2): 576-579 (2005)Strong Attenuation of the Transients' Effect in Square Waves Synthesized With a Programmable Josephson Voltage Standard., , , and . IEEE Trans. Instrumentation and Measurement, 59 (7): 1894-1899 (2010)Effects of metallic gates on AC measurements of the quantum Hall resistance., , and . IEEE Trans. Instrumentation and Measurement, 52 (2): 574-578 (2003)The OFMET Watt balance: Progress report., , , , , , , and . IEEE Trans. Instrumentation and Measurement, 50 (2): 583-586 (2001)Josephson-Voltage-Standard-Locked Sine Wave Synthesizer: Margin Evaluation and Stability., , , , and . IEEE Trans. Instrumentation and Measurement, 58 (4): 791-796 (2009)