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Assessing software reliability performance under highly critical but infrequent event occurrences., , , , , and . ISSRE, page 294-307. IEEE Computer Society, (1997)The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond., , , , and . VLSI Circuits, page 208-. IEEE, (2019)Power Control of Cellular Radio Systems Via Robust Smith Prediction Filter., , and . IEEE Trans. Wirel. Commun., 3 (5): 1822-1831 (2004)Trajectory generation for autonomous soaring UAS., and . ICAC, page 121-126. IEEE, (2011)Impact of Hf content on positive bias temperature instability reliability of HfSiON gate dielectrics., and . Microelectronics Reliability, 50 (5): 614-617 (2010)Electrical characteristics and reliability properties of metal-oxide-semiconductor capacitors with HfZrLaO gate dielectrics., and . Microelectronics Reliability, 50 (5): 599-602 (2010)Dynamic range analysis for the implementation of fast transform., , and . IEEE Trans. Circuits Syst. Video Techn., 5 (2): 178-180 (1995)Accident sequence analysis of human-computer interface design., and . Rel. Eng. & Sys. Safety, 67 (1): 29-40 (2000)Automatic current-sharing extendable two-channel LED driver with non-pulsating input current and zero dc flux., , and . I. J. Circuit Theory and Applications, 46 (8): 1462-1484 (2018)A 1.5-V 10-ppm/°C 2nd-order curvature-compensated CMOS bandgap reference with trimming., , , , and . ISCAS, IEEE, (2006)