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Syndrome Simulation And Syndrome Test For Unscanned Interconnects.

, , , and . Asian Test Symposium, page 62-67. IEEE Computer Society, (1996)

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A Practical Implementation Of Dynamic Testing Of An Ad Converter., , and . Asian Test Symposium, page 238-243. IEEE Computer Society, (1996)Syndrome Simulation And Syndrome Test For Unscanned Interconnects., , , and . Asian Test Symposium, page 62-67. IEEE Computer Society, (1996)Decentralized BIST for 1149.1 and 1149.5 Based Interconnects., , and . ED&TC, page 120-125. IEEE Computer Society, (1996)Metrology for analog module testing using analog testability bus., , , and . ICCAD, page 594-599. IEEE Computer Society / ACM, (1996)